Publication: The Effects of the External Conditions of CMOS IC Functioning on Latchup Occurrence under Uniform Laser Irradiation
Дата
2021
Авторы
Shvetsov-Shilovskiy, I. I.
Chumakov, A. I.
Pechenkin, A. A.
Bobrovsky, D. V.
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Аннотация
© 2021 IEEE.The paper concerns experimental results on external conditions such as temperature, voltage supply, current limit, and features of the power circuit on latchup occurrence under uniform laser irradiation.
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Цитирование
The Effects of the External Conditions of CMOS IC Functioning on Latchup Occurrence under Uniform Laser Irradiation / Shvetsov-Shilovskiy, I.I. [et al.] // Proceedings of the International Conference on Microelectronics, ICM. - 2021. - 2021-September. - P. 375-377. - 10.1109/MIEL52794.2021.9569126