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The Effects of the External Conditions of CMOS IC Functioning on Latchup Occurrence under Uniform Laser Irradiation

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dc.contributor.authorShvetsov-Shilovskiy, I. I.
dc.contributor.authorChumakov, A. I.
dc.contributor.authorPechenkin, A. A.
dc.contributor.authorBobrovsky, D. V.
dc.contributor.authorШвецов-Шиловский, Иван Иванович
dc.contributor.authorЧумаков, Александр Иннокентьевич
dc.contributor.authorПеченкин, Александр Александрович
dc.contributor.authorБобровский, Дмитрий Владимирович
dc.date.accessioned2024-11-29T22:30:21Z
dc.date.available2024-11-29T22:30:21Z
dc.date.issued2021
dc.description.abstract© 2021 IEEE.The paper concerns experimental results on external conditions such as temperature, voltage supply, current limit, and features of the power circuit on latchup occurrence under uniform laser irradiation.
dc.format.extentС. 375-377
dc.identifier.citationThe Effects of the External Conditions of CMOS IC Functioning on Latchup Occurrence under Uniform Laser Irradiation / Shvetsov-Shilovskiy, I.I. [et al.] // Proceedings of the International Conference on Microelectronics, ICM. - 2021. - 2021-September. - P. 375-377. - 10.1109/MIEL52794.2021.9569126
dc.identifier.doi10.1109/MIEL52794.2021.9569126
dc.identifier.urihttps://www.doi.org/10.1109/MIEL52794.2021.9569126
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85118466905&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/24906
dc.relation.ispartofProceedings of the International Conference on Microelectronics, ICM
dc.titleThe Effects of the External Conditions of CMOS IC Functioning on Latchup Occurrence under Uniform Laser Irradiation
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.volume2021-September
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