Publication: Radiation-Based Methods for Process and Layout Variablity Inspection of Trustworthy ICs
Дата
2025
Авторы
Moskovskaya, Y. M.
Nikiforov, A. Y.
Telets, V. A.
Strikhanov, M. N.
Kessarinskiy, L. N.
Boychenko, D. V.
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Radiation-Based Methods for Process and Layout Variablity Inspection of Trustworthy ICs / Moskovskaya, Y. M. [et al.] // 2025 IEEE 34th International Conference on Microelectronics, MIEL 2025 - Proceedings. - 2025. - 10.1109/MIEL66332.2025.11261148