Publication: Experimental Estimation of Input Offset Voltage Radiation Degradation Rate in Bipolar Operational Amplifiers
Дата
2019
Авторы
Bakerenkov, A.
Pershenkov, V.
Felitsyn, V.
Rodin, A.
Telets, V.
Belyakov, V.
Zhukov, A.
Glukhov, N.
Journal Title
Journal ISSN
Volume Title
Издатель
Аннотация
© 2019 IEEE.Radiation degradation rate of input offset voltage in bipolar operational amplifiers was estimated experimentally. High degradation rate was observed in devices with high input offset voltage initial values and temperature drifts. Obtained results were discussed.
Описание
Ключевые слова
Цитирование
Experimental Estimation of Input Offset Voltage Radiation Degradation Rate in Bipolar Operational Amplifiers / Bakerenkov, A. [et al.] // 2019 IEEE 31st International Conference on Microelectronics, MIEL 2019 - Proceedings. - 2019. - P. 251-254. - 10.1109/MIEL.2019.8889637
URI
https://www.doi.org/10.1109/MIEL.2019.8889637
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https://openrepository.mephi.ru/handle/123456789/18902