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Experimental Estimation of Input Offset Voltage Radiation Degradation Rate in Bipolar Operational Amplifiers

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dc.contributor.authorBakerenkov, A.
dc.contributor.authorPershenkov, V.
dc.contributor.authorFelitsyn, V.
dc.contributor.authorRodin, A.
dc.contributor.authorTelets, V.
dc.contributor.authorBelyakov, V.
dc.contributor.authorZhukov, A.
dc.contributor.authorGlukhov, N.
dc.contributor.authorБакеренков, Александр Сергеевич
dc.contributor.authorРодин, Александр Сергеевич
dc.contributor.authorТелец, Виталий Арсеньевич
dc.contributor.authorБеляков, Владимир Васильевич
dc.contributor.authorЖуков, Александр Иванович
dc.date.accessioned2024-11-21T14:52:59Z
dc.date.available2024-11-21T14:52:59Z
dc.date.issued2019
dc.description.abstract© 2019 IEEE.Radiation degradation rate of input offset voltage in bipolar operational amplifiers was estimated experimentally. High degradation rate was observed in devices with high input offset voltage initial values and temperature drifts. Obtained results were discussed.
dc.format.extentС. 251-254
dc.identifier.citationExperimental Estimation of Input Offset Voltage Radiation Degradation Rate in Bipolar Operational Amplifiers / Bakerenkov, A. [et al.] // 2019 IEEE 31st International Conference on Microelectronics, MIEL 2019 - Proceedings. - 2019. - P. 251-254. - 10.1109/MIEL.2019.8889637
dc.identifier.doi10.1109/MIEL.2019.8889637
dc.identifier.urihttps://www.doi.org/10.1109/MIEL.2019.8889637
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85075377421&origin=resultslist
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dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/18902
dc.relation.ispartof2019 IEEE 31st International Conference on Microelectronics, MIEL 2019 - Proceedings
dc.titleExperimental Estimation of Input Offset Voltage Radiation Degradation Rate in Bipolar Operational Amplifiers
dc.typeConference Paper
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