Персона: Некрасов, Павел Владимирович
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Design and Implementation of Home Assistant and TouchGFX Interaction Based on STM32 Microcontroller
2022, Zharikov, A. M., Kozin, D. A., Nekrasov, P. V., Жариков, Александр Михайлович, Некрасов, Павел Владимирович
© 2022 IEEE.internet of things (IoT) technologies has seen rapid development over the past decade. This factor also forced the development of related software products. 'Home Assistant' (HA) is a popular home automation software. This article presents the interaction interface between Home Assistant and TouchGFX framework, which is used in the development of smart devices with graphical user interface (GUI), based on STM32 microcontroller (MCU). Google protocol buffers serialization protocol (protobuf) and special addon for Home Assistant were implemented in entire system to increase performance of data transfer and processing. Then, real-time operating system (RTOS) queuing mechanism was used for interacting between MCU peripherals and TouchGFX framework. In conclusion two serialization protocols (protobuf and JSON) were compared in terms of encoding time and message size under the conditions of developed system.
Real-Time Technique for Semiconductor Material Parameter Measurement Under Continuous Neutron Irradiation with High Integral Fluence
2025, Vasil'evskii, I. S., Klochkov, A. N., Nekrasov, P. V., Vinichenko, A. N., Kargin, N. I., Васильевский, Иван Сергеевич, Клочков, Алексей Николаевич, Некрасов, Павел Владимирович, Виниченко, Александр Николаевич, Каргин, Николай Иванович
Investigation of Operating System Influence on Single Event Functional Interrupts Using Fault Injection and Hardware Error Detection in ARM Microcontroller
2021, Loskutov, I. O., Kravchenko, N. D., Marfin, V. A., Nekrasov, P. V., Bobrovsky, D. V., Smolin, A. A., Yanenko, A. V., Лоскутов, Илья Олегович, Кравченко, Николай Дмитриевич, Некрасов, Павел Владимирович, Бобровский, Дмитрий Владимирович, Яненко, Андрей Викторович
© 2021 IEEE.the paper presents a broad investigation of single event effects in ARM microcontroller (MCU) under heavy ion irradiation. Experimental details are presented: device under the test and test setup. The stages of experiments are described: radiation testing using heavy ion accelerator, laser source irradiation and single event functional interrupts simulation campaign. The algorithm of operation of the program injector for conducting campaigns on simulating SEFI is presented. The influence of a real-time operating system on cross-section of SEFI was evaluated. SEFI cross-sections obtained with and without the operating system were compared. A method using fault injection in program and data memory and hardware detection of functional interrupts was tested. The results of SEFI simulation and calculation by engineering model were compared with experimental results. The results obtained differ from each other. Possible explanations of the proposed differences and the correction of the model are proposed. Directions for further research are outlined.
Методы и средства прогнозирования радиационной стойкости микропроцессорных СБИС
2010, Некрасов, П. В., Некрасов, Павел Владимирович, Калашников, О. А.