Publication: Methodical Approach for SEL Tolerance Confirmation of CMOS ICs at Low Temperatures
Дата
2021
Авторы
Novikova, M. M.
Novikov, A. A.
Pechenkin, A. A.
Lukashin, V. P.
Oblova, E. N.
Gritsaenko, A. R.
Protasov, D. E.
Tararaksin, A. S.
Journal Title
Journal ISSN
Volume Title
Издатель
Аннотация
An approach for SEL sensitivity estimation using heavy ions at room temperature and laser facilities both at room and subzero temperatures is proposed. The results of comparison approach approbation are also presented. © 2021 IEEE.
Описание
Ключевые слова
Heavy ions , Laser technique , Low temperature , SEL
Цитирование
Methodical Approach for SEL Tolerance Confirmation of CMOS ICs at Low Temperatures / Novikova, M.M. [et al.] // RADECS 2021 - European Conference on Radiation and its Effects on Components and Systems. - 2021. - 10.1109/RADECS53308.2021.9954467