Publication: “True” dose rate effect of the eldrs conversion model
Дата
2020
Авторы
Pershenkov, V. S.
Bakerenkov, A. S.
Telets, V. A.
Belyakov, V. V.
Felitsyn, V. A.
Rodin, A. S.
Journal Title
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Volume Title
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Аннотация
© Springer Nature Switzerland AG 2020.Modification of the ELDRS (Enhanced Low Dose Rate Sensitivity) conversion model is presented. The effect of the oxide trapped charge on the value of the oxide electric field and the yield of the oxide charge takes into account. It leads to dependence of the accumulation of radiation-induced oxide charge and interface traps on the dose rate. In enhancement version the ELDRS conversion model describes the low dose rate effect as “true” dose rate effect.
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Цитирование
“True” dose rate effect of the eldrs conversion model / Pershenkov, V.S. [et al.] // IFMBE Proceedings. - 2020. - 77. - P. 61-65. - 10.1007/978-3-030-31866-6_13
URI
https://www.doi.org/10.1007/978-3-030-31866-6_13
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https://openrepository.mephi.ru/handle/123456789/20067
https://www.scopus.com/record/display.uri?eid=2-s2.0-85075626568&origin=resultslist
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000552314200013
https://openrepository.mephi.ru/handle/123456789/20067