Publication: Method for Determining the Most Sensitive Region of an Optocoupler Chip under X-ray-Induced Dose Effects
Дата
2019
Авторы
Ranneva, E. V.
Verizhnikov, A. I.
Tsyrlov, A. M.
Fedosov, V. S.
Chernyak, M. E.
Ulanova, A. V.
Nikiforov, A. Y.
Kalashnikov, V. D.
Titovets, D. O.
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© 2019, Pleiades Publishing, Ltd.Abstract: This paper is devoted to analyzing the effect of gamma radiation on the behavior of optocouplers. According to a series of experiments that involve masking various parts of a chip from X-ray irradiation, the most sensitive region of the chip is determined and the design of the optocoupler is improved. Upon modification, the radiation hardness of the device more than triples.
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Method for Determining the Most Sensitive Region of an Optocoupler Chip under X-ray-Induced Dose Effects / Ranneva, E.V. [et al.] // Russian Microelectronics. - 2019. - 48. - № 6. - P. 415-421. - 10.1134/S1063739719060039