Персона: Ширин, Алексей Олегович
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Институт интеллектуальных кибернетических систем
Цель ИИКС и стратегия развития - это подготовка кадров, способных противостоять современным угрозам и вызовам, обладающих знаниями и компетенциями в области кибернетики, информационной и финансовой безопасности для решения задач разработки базового программного обеспечения, повышения защищенности критически важных информационных систем и противодействия отмыванию денег, полученных преступным путем, и финансированию терроризма.
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Алексей Олегович
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- ПубликацияТолько метаданныеThe Radio Monitoring Complex by Continuous Analysis of Energy Spectra of Radio Signals Based on USRP FPGA and LabVIEW(2021) Kessarinskiy, L. N.; Shirin, A. O.; Arabian, S. G.; Gorbatov, V. S.; Durakovskiy, A. P.; Кессаринский, Леонид Николаевич; Ширин, Алексей Олегович; Горбатов, Виктор Сергеевич; Дураковский, Анатолий Петрович© 2021 IEEE.The purpose of the article is to develop an automated measuring complex for conducting research of radio signals using modern technologies: a software-defined radio device, access to high-speed analog-to-digital signal processing and the use of an FPGA-based platform for the implementation of electronic devices. The relevance of the work is determined by the need to create a universal compact configurable device, that takes advantage of the technologies described above and, as a result, have lower power consumption, weight and dimensions, low cost and stealth. The description of a newly developed hardware and software complex, based on the budget platform of software-defined radio devices, is given. It is operating in the 10 MHz - 6 GHz range, compactly portable, using the hardware capabilities of the FPGA for processing and analyzing the radio signal "on the fly", which implements additional services facilitating analysis for the operator. The use of FPGA allowed to reduce the sweep time significantly.
- ПубликацияТолько метаданныеРазработка проекта методики оценки соответствия СЗИ требованиям доверия в части аппаратных средств(2022) Ширин, А. О.; Ширин, Алексей Олегович; Кессаринский Леонид НиколаевичТРЕБОВАНИЯ, УРОВЕНЬ ДОВЕРИЯ, СЗИ, ЭКБ, ПРОВЕРКА, ОЦЕНКА, МИКРОСХЕМА, ИСПЫТАТЕЛЬНАЯ ЛАБОРАТОРИЯ Цель работы – разработка проекта методики оценки соответствия СЗИ требованиям доверия в части аппаратных средств. Объектом исследования является сертифицированное средство защиты информации, которое находится в государственном реестре. В ходе научной работы был проведен анализ требований доверия ФСТЭК Россия. Были выделены разделы, относящихся к аппаратной части СЗИ. Для разработки методики были адаптированы рабочие места и закуплены необходимые инструменты для выполнения данной задачи. В результате исследования разработан проект методики оценки соответствия СЗИ требованиям доверия в части аппаратных средств
- ПубликацияТолько метаданныеSingle Event Burnout Sensitivity Prediction Based on Commercial MOSFET Electrical Characteristics Analysis(2021) Kessarinskiy, V. S.; Kessarinskiy, L. N.; Tararaksin, A. S.; Shirin, A. O.; Boychenko, D. V.; Кессаринский, Леонид Николаевич; Тарараксин, Александр Сергеевич; Ширин, Алексей Олегович; Бойченко, Дмитрий Владимирович© 2021 IEEE.Power MOSFET transistors are the main part of the power supply system for any equipment, including spacecraft. Modern vertical MOSFETs are designed as regular matrix structures of elementary parallel cells (mini-transistors), made according to submicron process. Single event burnout (SEB) of a vertical cell is the main mechanism for failure of vertical MOSFETs from single particle effect. In addition to SEB, there are several other reasons for the MOSFET burnout, caused by extremal bias, that are tested during manufacturing. The MOSFETs SEB sensitivity prediction model is presented. The model is based on the analysis of burnout bias characteristics from the datasheets. The comparison of experimental data and model prediction results is presented in the article. The figure of merit (FOM) for SEB sensitivity prediction is proposed. The optimal value of FOM for n-MOSFETs and LET 40 MeV cm2/mg is presented. So, the model helps to determine the most sensitive MOSFET transistors before expensive testing done.
- ПубликацияТолько метаданныеSimultaneous Parametric and Functional Testing of Digital VLSI during Radiation Experiments(2021) Arabyan, S.; Shuvalov, V.; Kessarinskiy, L.; Shirin, A.; Boychenko, D.; Кессаринский, Леонид Николаевич; Ширин, Алексей Олегович; Бойченко, Дмитрий Владимирович© 2021 IEEE.In the light of the improvements of integration technologies and testing instruments, an automated testing system based on state-of-the-art technical solutions for automatic test equipment is introduced. The use of PXIe-6570 in the development process of automatic test equipment is presented. Some aspects of importance when migrating to PXIe-6570 are given. Efficiency of newly developed features of PXIe-6570 is demonstrated on the introduced automated testing system. The advantage of digital pattern instruments over digital waveform instruments is presented in the comparison of the essential features of those instruments. The architecture of the project developed in Digital Pattern Editor is given. The application for conducting parametric measurements of the microcircuitry is described. It is shown that digital pattern instruments enhance the facilities of development of automated testing systems with the features of modularity, which allows to make small changes in the modules, without affecting the whole project and to customize given projects to conduct tests on various microcircuits.
- ПубликацияТолько метаданныеThe Use of Microelectronics Radiation Behavior as Physical Uncloned Function to Find Counterfeit(2020) Hovsepyan, H. A.; Kessarinskiy, L. N.; Shirin, A. O.; Кессаринский, Леонид Николаевич; Ширин, Алексей Олегович© 2020 IEEE.The article is devoted to the problem of counterfeiting electronic devices. The global trend is that the number of counterfeit microcircuits (and not only ICs) is increasing, but the effectiveness of detection methods is falling. Even using all known methods, the probability of identifying counterfeit is only a few percent. One of the methods to combat counterfeiting is to label authentic components. And the most secure label technique based on physical uncloned functions (PUF). So it is proposed to use the different features of radiation behavior degradation as PUF. A few examples of this use are presented in the article.