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Васькин, Роман Евгеньевич

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Роман Евгеньевич
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  • Публикация
    Только метаданные
    A Methodical Approach to the Study of the Radiation Hardness of Transceivers under the Total Dose Effect and Heavy Ions Exposure
    (2022) Vaskin, R.; Sorokoumov, G.; Saprykina, V.; Васькин, Роман Евгеньевич; Сорокоумов, Георгий Сергеевич; Сапрыкина, Василина Сергеевна
    © 2022 IEEE.This article presents a methodological approach to measuring the parameters of the criterion of acceptability for transceivers during a radiation experiment. The article describes the main radiation effects in transceivers when exposed to ionizing radiation from outer space. A classification of failures in transceivers and methods for carrying out functional and parametric control are also presented.
  • Публикация
    Только метаданные
    The Optimal Measuring System Composition for the Transceivers Radiation Hardness Investigation
    (2021) Vaskin, R. E.; Kalashnikov, V. D.; Sorokoumov, G. S.; Boychenko, D. V.; Васькин, Роман Евгеньевич; Калашников, Владислав Дмитриевич; Сорокоумов, Георгий Сергеевич; Бойченко, Дмитрий Владимирович
    © 2021 IEEE.Modern transceivers are widely used in the design of the on-board equipment of spacecraft. The effects of space ionizing radiation can lead to failures in operation of transceivers, leading to a loss of the transmitted data. It is necessary to provide radiation hardness assurance of transceivers in order to evaluate the rate of upsets in the operation of transceivers used the on-board equipment of spacecraft. The paper describes main types of failures observed in interface ICs operating in space radiation environment. The classification of functional failures in transceivers exposed to ionizing radiation and monitoring methods are presented in this paper. Parameters of transceivers that has to be monitored during radiation testing are listed. We reviewed National Instruments equipment used in radiation testing of different types of transceivers. A measuring system based on this equipment was used for radiation testing of TLK2711 transceiver in loop operation mode over a serial data channel.