Publication: Ultimate design and testing TPTS-based control systems with using full-scaled physical models of nuclear power plants
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2019
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© 2019 Published under licence by IOP Publishing Ltd. Radiation degradation rate of base current in SiGe HBTs was experimentally investigated using X-ray irradiation source with Cu anode at room and low temperatures. The dependences of base and collector current on the emitter-base voltage of the transistors were measured during radiation impact and presented for different total dose levels and irradiation conditions.
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Zhukov, I. M. Ultimate design and testing TPTS-based control systems with using full-scaled physical models of nuclear power plants / Zhukov, I.M., Tolokonsky, A.O. // IOP Conference Series: Materials Science and Engineering. - 2019. - 498. - № 1. - 10.1088/1757-899X/498/1/012044
URI
https://www.doi.org/10.1088/1757-899X/498/1/012044
https://www.scopus.com/record/display.uri?eid=2-s2.0-85065566840&origin=resultslist
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https://openrepository.mephi.ru/handle/123456789/17964
https://www.scopus.com/record/display.uri?eid=2-s2.0-85065566840&origin=resultslist
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000472784800044
https://openrepository.mephi.ru/handle/123456789/17964