Publication:
Ultimate design and testing TPTS-based control systems with using full-scaled physical models of nuclear power plants

dc.contributor.authorZhukov, I. M.
dc.contributor.authorTolokonsky, A. O.
dc.contributor.authorТолоконский, Андрей Олегович
dc.date.accessioned2024-11-21T08:25:49Z
dc.date.available2024-11-21T08:25:49Z
dc.date.issued2019
dc.description.abstract© 2019 Published under licence by IOP Publishing Ltd. Radiation degradation rate of base current in SiGe HBTs was experimentally investigated using X-ray irradiation source with Cu anode at room and low temperatures. The dependences of base and collector current on the emitter-base voltage of the transistors were measured during radiation impact and presented for different total dose levels and irradiation conditions.
dc.identifier.citationZhukov, I. M. Ultimate design and testing TPTS-based control systems with using full-scaled physical models of nuclear power plants / Zhukov, I.M., Tolokonsky, A.O. // IOP Conference Series: Materials Science and Engineering. - 2019. - 498. - № 1. - 10.1088/1757-899X/498/1/012044
dc.identifier.doi10.1088/1757-899X/498/1/012044
dc.identifier.urihttps://www.doi.org/10.1088/1757-899X/498/1/012044
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85065566840&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000472784800044
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/17964
dc.relation.ispartofIOP Conference Series: Materials Science and Engineering
dc.titleUltimate design and testing TPTS-based control systems with using full-scaled physical models of nuclear power plants
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.issue1
oaire.citation.volume498
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