2019, Chumakov, A. I., Bobrovsky, D. V., Pechenkin, A. A., Savchenkov, D. V., Sorokoumov, G. S., Shvetsov-Shilovskiy, I. I., Чумаков, Александр Иннокентьевич, Бобровский, Дмитрий Владимирович, Печенкин, Александр Александрович, Сорокоумов, Георгий Сергеевич, Швецов-Шиловский, Иван Иванович

© 2019, Pleiades Publishing, Ltd.Abstract: The results of research on nonstationary latchup effects (LEs) under the influence of heavy charged particles and ionizing radiation pulses, which are spontaneously counteracted depending on the operating conditions, are presented. This behavior is caused by the effects of the rail span collapse inside the complementary metal-oxide-system (CMOS) of very large scale integrated (VLSI) circuits. The experimental studies are carried out on both the ion accelerator and the laser facilities.

2021, Vaskin, R. E., Kalashnikov, V. D., Sorokoumov, G. S., Boychenko, D. V., Васькин, Роман Евгеньевич, Калашников, Владислав Дмитриевич, Сорокоумов, Георгий Сергеевич, Бойченко, Дмитрий Владимирович

© 2021 IEEE.Modern transceivers are widely used in the design of the on-board equipment of spacecraft. The effects of space ionizing radiation can lead to failures in operation of transceivers, leading to a loss of the transmitted data. It is necessary to provide radiation hardness assurance of transceivers in order to evaluate the rate of upsets in the operation of transceivers used the on-board equipment of spacecraft. The paper describes main types of failures observed in interface ICs operating in space radiation environment. The classification of functional failures in transceivers exposed to ionizing radiation and monitoring methods are presented in this paper. Parameters of transceivers that has to be monitored during radiation testing are listed. We reviewed National Instruments equipment used in radiation testing of different types of transceivers. A measuring system based on this equipment was used for radiation testing of TLK2711 transceiver in loop operation mode over a serial data channel.

2019, Akhmetov, A. O., Sorokoumov, G. S., Smolin, A. A., Bobrovsky, D. V., Boychenko, D. V., Nikiforov, A. Y., Сорокоумов, Георгий Сергеевич, Бобровский, Дмитрий Владимирович, Бойченко, Дмитрий Владимирович, Никифоров, Александр Юрьевич

© 2019 IEEE.The paper presents single event upset (SEU) experimental results in Spartan-6 FPGA due to direct and indirect proton ionization. High energy proton beam and aluminum foils were used to decrease proton energy down to 1.. 20 MeV to observe proton direct ionization upsets.

2021, Torshin, R. S., Sorokoumov, G. S., Bobrovsky, D. V., Titovets, D. O., Kalashnikova, M. O., Торшин, Роман Сергеевич, Сорокоумов, Георгий Сергеевич, Бобровский, Дмитрий Владимирович, Титовец, Дмитрий Олегович

© 2021 IEEE.The paper presents an automated system for functional and parametric control of analog-to-digital converters (ADC) during a radiation experiment. The automated measuring system is based on the combined use of modular PXI equipment manufactured by National Instruments and the signal generator SMA100B manufactured by Rohde Schwarz (RS). The PXI-4461 module is the most significant module in the system. Hardware and software operations of the measuring system are discussed in the paper. The parameters controlled during total ionizing dose (TID) tests are listed in the paper alongside the algorithm for parametric control. We describe a histogram method for removing input noise. In order to mitigate drawbacks of histogram method, we measured sample median for each ADC code value during the experiment. With the help of this system, the main static and dynamic parameters of test ADCs are calculated and their degradation during irradiation at the Cs-137 isotope source is shown. Specifications for quantifying ADC dynamic performance were based on an FFT results analysis. Typical TID effects in ADCs are observed: degradation of the transfer function and associated deterioration of the accuracy parameters: integral nonlinearity, differential nonlinearity, offset and gain errors.