2021, Shirin, A. O., Koval, K. A., Taiibov, F. F., Kameneva, A. S., Kessarinskiy, L. N., Durakovskiy, A. P., Коваль, Кирилл Александрович, Кессаринский, Леонид Николаевич, Дураковский, Анатолий Петрович

© 2021 IEEE.The work is devoted to counterfeiting electronic components. The results of the use of visual analysis of the surface and marking are presented. Only the use of a set of methods allows you to give a reliable result. The optimal set of methods is determined by the qualifications of the researcher.

2021, Shirin, A. O., Taiibov, F. F., Kameneva, A. S., Kessarinskiy, L. N., Koval, K. A., Boychenko, D. V., Кессаринский, Леонид Николаевич, Коваль, Кирилл Александрович, Бойченко, Дмитрий Владимирович

© 2021 IEEE.The article is devoted to the problem of identifying counterfeit electronic components. The article presents the results of complex test methods such as weighing and X-ray structural analysis. It is shown that the same counterfeit defects can be detected in different ways. But the best performance and reliability of the results are provided by a set of methods.

2021, Shirin, A. O., Taiibov, F. F., Simakhin, E. A., Kessarinskiy, L. N., Koval, K. A., Artamonov, A. S., Durakovskiy, A. P., Симахин, Егор Андреевич, Кессаринский, Леонид Николаевич, Коваль, Кирилл Александрович, Артамонов, Алексей Сергеевич, Дураковский, Анатолий Петрович

© 2021 IEEE.The problem of counterfeit products, electronic and electromechanical products is presented. One of the most effective non-destructive electronics analyses is x-ray checking, that is presented in this paper.