2019_Взаимодействие ионов с поверхностью (ВИП)
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- ПубликацияОткрытый доступРАДИАЦИОННОЕ УПЛОТНЕНИЕ УРАН-ГАДОЛИНИЕВОГО ТОПЛИВА(НИЯУ МИФИ, 2019) Девятк, Ю. Н.; Новиков, В. В.; Хомяков, О. В.; Новиков, Владимир Владимирович; Хомяков, Олег ВладимировичA model of radiation-induced densification of uranium-gadolinium fuel was developed. The fuel is established to be in the brittle state in the volume of uranium-gadolinium fuel pellet containing a burnable neutron absorber under irradiation and in the plastic state out of this volume. The relative change in a pellet volume for uranium-gadolinium fuel is shown to be lower than that for uranium oxide nuclear fuel with the same microstructure.
- ПубликацияОткрытый доступИССЛЕДОВАНИЕ ПОВРЕЖДЕНИЙ В МОНОКРИСТАЛЛАХ Y3Fe5O12, ОБЛУЧЕННЫХ БЫСТРЫМИ ТЯЖЕЛЫМИ ИОНАМИ, МЕТОДОМ РАМАНОВСКОЙ СПЕКТРОСКОПИИ(НИЯУ МИФИ, 2019) Мутали, А. К.; Сайфулин, М. М.; Скуратов, В. А.; Янсе ван Вуурен, А.; О’Коннелл, Ж. Г.; Скуратов, Владимир АлексеевичThe Raman spectroscopy method was used to study the radiation damage formed along the path of swift heavy ions in a yttrium iron garnet (Y3Fe5O12, YIG). YIG single crystals have been irradiated with swift Xe and Bi ions with energies of 167 and 715 MeV, respectively. Irradiation was carried out at room temperature in the range of fluences from 1011 to 1013 ions /cm2. The results obtained in this work is compared with previously obtained direct data (transmission electron microscopy) and indirect methods (Rutherford backscattering spectroscopy, X-ray diffraction).
- ПубликацияОткрытый доступESTIMATES OF He+ SCATTERED FROM THE SURFACE SURVIVAL PROBABILITY USING BINARY COLLISIONS CODES(НИЯУ МИФИ, 2019) Mamedo, N. V.; Kurnaev, V. A.; Sinelnikov, D. N.; Mamedov, I. M.; Синельников, Дмитрий Николаевич; Мамедов, Никита ВадимовичLow-energy (1-20 keV) ion scattering spectroscopy is the widespread method of surface analysis [1,2]. The surface layer composition can be reconstructed from narrow peaks in the energy spectra of the scattered inert gas ions and recoil ions [3]. The main advantage of the surface analysis using inert gas ions is the high sensitivity to the first layer of surface atoms. This is due to the low initial energy of the ions (and therefore small ion penetration depth) and the high neutralization probability of the reflected ions, which increases with the penetration depth of the incident particle into the solid [3]. However, for quantitative surface analysis, it is extremely important to determine the neutralization probability (or the probability of ion survival), since this method usually detects reflected ions only.
- ПубликацияОткрытый доступAPPLICATION OF KEV-ENERGY PROTON SCATTERING FOR SURFACE ANALYSIS(НИЯУ МИФИ, 2019) Bulgadaryan, D.; Sinelnikov, D.; Kurnaev, V.; Efimov, N.; Ефимов, Никита Евгеньевич; Синельников, Дмитрий НиколаевичLow- and medium-energy ion scattering (LEIS/MEIS) are widely used techniques of surface analysis [1–4]. Conventional LEIS/MEIS setups utilize noble gas ions and electrostatic energy analyzers that makes these methods very sensitive to composition of the uppermost atomic layers of an analyzed sample. However, high neutralization probability of noble gas ions restricts LEIS/MEIS depth profiling capabilities [5]. The use of hydrogen ions with lower neutralization probability instead of noble gas provides possibility to measure the thickness of surface layer if its atomic mass is very different from that of underlying target, that is the case e.g. in nanoelectronics [6] or for redeposition of plasma-facing materials in fusion devices [7]. In this work we present simulated and experimental data on implementation of keV-energy proton scattering (KEPS) for surface analysis.
- ПубликацияОткрытый доступЧИСЛЕННАЯ МОДЕЛЬ ВРЕМЯПРОЛЕТНОГО АНАЛИЗАТОРА ДЛЯ ПУЧКА КЛАСТЕРНЫХ ИОНОВ Ar(НИЯУ МИФИ, 2019) Бакун, А. Д.; Гусев, А. С.; Каргин, Н. И.; Колодко, Д. В.; Рындя, С. М.; Сигловая, Н. В.; Агейченков, Д. Г.; Гусев, Александр Сергеевич; Колодко, Добрыня Вячеславич; Рындя, Сергей Михайлович; Каргин, Николай Иванович; Бакун, Алексей Дмитриевич; Сигловая, Наталия ВладимировнаPolishing with cluster ions makes it possible to obtain nanorelief on various materials. Often in such installations, the ion mass distribution is not known reliably. This paper presents the results of a time-of-flight mass analyzer simulation. The time-of-flight analyzer will be used for separation of cluster ions on the Exogenesis nAccel 100 unit.