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Experimental Estimation of Intercorrelation Between Radiation Effects and Semiconductor Detectors Measuring Characteristics Used for Static Radiation Detection of Nuclear Reactors

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dc.contributor.authorBarmakov, Y. N.
dc.contributor.authorButin, V. I.
dc.contributor.authorButin, I. V.
dc.contributor.authorБутин, Валентин Иванович
dc.date.accessioned2025-09-25T16:25:09Z
dc.date.available2025-09-25T16:25:09Z
dc.date.issued2025
dc.format.extentС. 50-53
dc.identifier.citationBarmakov, Y. N. Experimental Estimation of Intercorrelation Between Radiation Effects and Semiconductor Detectors Measuring Characteristics Used for Static Radiation Detection of Nuclear Reactors / Barmakov, Y. N., Butin, V. I., Butin, I. V. // International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. - 2025. - P. 50-53. - 10.1109/EDM65517.2025.11096672
dc.identifier.doi10.1109/EDM65517.2025.11096672
dc.identifier.urihttps://www.doi.org/10.1109/EDM65517.2025.11096672
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-105014156755&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/38610
dc.relation.ispartofInternational Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
dc.titleExperimental Estimation of Intercorrelation Between Radiation Effects and Semiconductor Detectors Measuring Characteristics Used for Static Radiation Detection of Nuclear Reactors
dc.typeConference Paper
dspace.entity.typePublication
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