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Nonthermal Mechanism of Defect Formation in the CdHgTe Semiconductor on Exposure to Soft X-rays

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dc.contributor.authorSredin, V. G.
dc.contributor.authorRamakoti, R. S.
dc.contributor.authorAnan'in, O. B.
dc.contributor.authorMelekhov, A. P.
dc.contributor.authorGerasimov, I. A.
dc.contributor.authorBogdanov, G. S.
dc.contributor.authorNovikov, I. K.
dc.contributor.authorFrolova, I. V.
dc.contributor.authorDzhumaev, P. S.
dc.contributor.authorРамакоти, Рави Шрираджа
dc.contributor.authorМелехов, Андрей Петрович
dc.contributor.authorГерасимов, Иван Александрович
dc.contributor.authorБогданов, Глеб Сергеевич
dc.contributor.authorНовиков, Игорь Кимович
dc.contributor.authorДжумаев, Павел Сергеевич
dc.date.accessioned2024-11-21T18:23:47Z
dc.date.available2024-11-21T18:23:47Z
dc.date.issued2019
dc.description.abstract© 2019, Pleiades Publishing, Ltd.The effect of irradiation with soft X-rays produced by a laser plasma source equipped with an X-ray concentrator on the properties of the CdHgTe semiconductor are investigated. For this purpose, the mass concentration of atoms in the near-surface layer of the material is measured. It is demonstrated that the action of soft X-ray radiation leads to change in the solid-solution composition at the surface via a nonthermal mechanism and generates surface defects.
dc.format.extentС. 1571-1575
dc.identifier.citationNonthermal Mechanism of Defect Formation in the CdHgTe Semiconductor on Exposure to Soft X-rays / Sredin, V.G. [et al.] // Physics of Atomic Nuclei. - 2019. - 82. - № 11. - P. 1571-1575. - 10.1134/S1063778819110188
dc.identifier.doi10.1134/S1063778819110188
dc.identifier.urihttps://www.doi.org/10.1134/S1063778819110188
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85082503556&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000520708000025
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/19501
dc.relation.ispartofPhysics of Atomic Nuclei
dc.titleNonthermal Mechanism of Defect Formation in the CdHgTe Semiconductor on Exposure to Soft X-rays
dc.typeArticle
dspace.entity.typePublication
oaire.citation.issue11
oaire.citation.volume82
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