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Study of terahertz reflection spectra of optically thin RDX samples by terahertz imaging with spectral resolution

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dc.contributor.authorPlekhanov, A. A.
dc.contributor.authorAkmalov, A. E.
dc.contributor.authorKotkovskii, G. E.
dc.contributor.authorKozlovskii, K. I.
dc.contributor.authorKuzishchin, Y. A.
dc.contributor.authorMartynov, I. L.
dc.contributor.authorMaximov, E. M.
dc.contributor.authorOsipov, E. V.
dc.contributor.authorChistyakov, A. A.
dc.contributor.authorПлеханов, Андрей Александрович
dc.contributor.authorАкмалов, Артём Эдуардович
dc.contributor.authorКотковский, Геннадий Евгеньевич
dc.contributor.authorКозловский, Константин Иванович
dc.contributor.authorКузищин, Юрий Александрович
dc.contributor.authorМартынов, Игорь Леонидович
dc.contributor.authorМаксимов, Евгений Михайлович
dc.contributor.authorОсипов, Евгений Валерьевич
dc.contributor.authorЧистяков, Александр Александрович
dc.date.accessioned2024-12-28T09:53:59Z
dc.date.available2024-12-28T09:53:59Z
dc.date.issued2023
dc.identifier.citationStudy of terahertz reflection spectra of optically thin RDX samples by terahertz imaging with spectral resolution / Plekhanov, A. A. [et al.] // Optical Engineering. - 2023. - 62. - № 3. - 10.1117/1.OE.62.3.034109
dc.identifier.doi10.1117/1.OE.62.3.034109
dc.identifier.urihttps://www.doi.org/10.1117/1.OE.62.3.034109
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dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/30075
dc.relation.ispartofOptical Engineering
dc.titleStudy of terahertz reflection spectra of optically thin RDX samples by terahertz imaging with spectral resolution
dc.typeArticle
dspace.entity.typePublication
oaire.citation.issue3
oaire.citation.volume62
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