Publication:
Modeling of polygonal half-loops dislocations in silicon single crystal using X-ray diffraction topo-tomography data

dc.contributor.authorKonarev, P. V.
dc.contributor.authorZolotov, D. A.
dc.contributor.authorBuzmakov, A. V.
dc.contributor.authorGrigoriev, V. A.
dc.contributor.authorГригорьев, Владислав Анатольевич
dc.date.accessioned2024-11-29T22:16:27Z
dc.date.available2024-11-29T22:16:27Z
dc.date.issued2021
dc.description.abstract© 2021 Institute of Physics Publishing. All rights reserved.Topo-tomographic methods for identifying defects in semiconductors are the most effective among X-ray methods. Combining experimental data with model calculations makes it possible to determine various parameters and properties of crystal structures. In this work, using X-ray diffraction topo-tomography, images of the dislocation half-loop in Si (111) crystal were obtained. The Takagi-Taupin equations have been used to modeling the topograms. A quantitative comparison of the images made it possible to determine the direction of the Burgers vector.
dc.identifier.citationModeling of polygonal half-loops dislocations in silicon single crystal using X-ray diffraction topo-tomography data / Konarev, P.V. [et al.] // Journal of Physics: Conference Series. - 2021. - 2036. - № 1. - 10.1088/1742-6596/2036/1/012015
dc.identifier.doi10.1088/1742-6596/2036/1/012015
dc.identifier.urihttps://www.doi.org/10.1088/1742-6596/2036/1/012015
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85118586730&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/24885
dc.relation.ispartofJournal of Physics: Conference Series
dc.titleModeling of polygonal half-loops dislocations in silicon single crystal using X-ray diffraction topo-tomography data
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.issue1
oaire.citation.volume2036
relation.isAuthorOfPublicationd7e45518-6531-496c-b85c-7b1898447eec
relation.isAuthorOfPublication.latestForDiscoveryd7e45518-6531-496c-b85c-7b1898447eec
relation.isOrgUnitOfPublicationba0b4738-e6bd-4285-bda5-16ab2240dbd1
relation.isOrgUnitOfPublication.latestForDiscoveryba0b4738-e6bd-4285-bda5-16ab2240dbd1
Файлы
Коллекции