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Advanced Measurement Systems for ADC/DAC Characterization: Methodology, Hardware and Local Dose-Enhancement Effects

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dc.contributor.authorTorshin, R.
dc.contributor.authorТоршин, Роман Сергеевич
dc.date.accessioned2026-06-02T09:58:59Z
dc.date.available2026-06-02T09:58:59Z
dc.date.issued2025
dc.identifier.citationTorshin, R. Advanced Measurement Systems for ADC/DAC Characterization: Methodology, Hardware and Local Dose-Enhancement Effects / Torshin, R. // Proceedings of the 17th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2025. - 2025. - 10.1109/APEIE66761.2025.11289416
dc.identifier.doi10.1109/APEIE66761.2025.11289416
dc.identifier.urihttps://www.doi.org/10.1109/APEIE66761.2025.11289416
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-105031765804&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/42682
dc.relation.ispartofProceedings of the 17th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2025
dc.titleAdvanced Measurement Systems for ADC/DAC Characterization: Methodology, Hardware and Local Dose-Enhancement Effects
dc.typeConference Paper
dspace.entity.typePublication
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relation.isAuthorOfPublication.latestForDiscoverye9190618-47bd-4a56-9e00-01906ccce33d
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