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Application of 2D Walsh-Hadamard transform in SRAM upset bitmaps processing

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dc.contributor.authorPilipenko, A. S.
dc.contributor.authorZubkov, L. S.
dc.contributor.authorTikhonov, M. I.
dc.contributor.authorЗубков, Лев Станиславович
dc.date.accessioned2024-12-04T10:42:43Z
dc.date.available2024-12-04T10:42:43Z
dc.date.issued2024
dc.identifier.citationPilipenko, A. S. Application of 2D Walsh-Hadamard transform in SRAM upset bitmaps processing / Pilipenko, A.S., Zubkov, L.S., Tikhonov, M.I. // Microelectronics Reliability. - 2024. - 157. - 10.1016/j.microrel.2024.115398
dc.identifier.doi10.1016/j.microrel.2024.115398
dc.identifier.urihttps://www.doi.org/10.1016/j.microrel.2024.115398
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85190752954&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/25949
dc.relation.ispartofMicroelectronics Reliability
dc.subjectBitmap
dc.subjectUpset
dc.subjectIC Reverse Engineering
dc.subjectIntegrated Circuits
dc.subjectTime-Resolved Imaging
dc.subjectEmbedded Cores
dc.subjectSingle event upset
dc.titleApplication of 2D Walsh-Hadamard transform in SRAM upset bitmaps processing
dc.typeArticle
dspace.entity.typePublication
oaire.citation.volume157
relation.isAuthorOfPublication703feabf-c022-4ffa-8af5-b71cfb832d08
relation.isAuthorOfPublication.latestForDiscovery703feabf-c022-4ffa-8af5-b71cfb832d08
relation.isOrgUnitOfPublication06e1796d-4f55-4057-8d7e-bb2f3b5676f5
relation.isOrgUnitOfPublication.latestForDiscovery06e1796d-4f55-4057-8d7e-bb2f3b5676f5
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