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Practical Evaluation of Optocouplers TID-Hardness Research Method Using an X-ray Unit

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dc.contributor.authorNovikov, S. V.
dc.contributor.authorCherniak, M. E.
dc.contributor.authorMozhaev, R. K.
dc.contributor.authorBoychenko, D. V.
dc.contributor.authorМожаев, Роман Константинович
dc.contributor.authorБойченко, Дмитрий Владимирович
dc.date.accessioned2024-11-21T14:55:29Z
dc.date.available2024-11-21T14:55:29Z
dc.date.issued2019
dc.description.abstract© 2019 IEEE.The article describes an optoisolators radiation hardness testing method to the effects of absorbed dose using an x-ray unit. Technological issues and features of the research are highlighted.
dc.format.extentС. 103-106
dc.identifier.citationPractical Evaluation of Optocouplers TID-Hardness Research Method Using an X-ray Unit / Novikov, S.V. [et al.] // 2019 IEEE 31st International Conference on Microelectronics, MIEL 2019 - Proceedings. - 2019. - P. 103-106. - 10.1109/MIEL.2019.8889615
dc.identifier.doi10.1109/MIEL.2019.8889615
dc.identifier.urihttps://www.doi.org/10.1109/MIEL.2019.8889615
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85075335003&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000565455600019
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/18912
dc.relation.ispartof2019 IEEE 31st International Conference on Microelectronics, MIEL 2019 - Proceedings
dc.titlePractical Evaluation of Optocouplers TID-Hardness Research Method Using an X-ray Unit
dc.typeConference Paper
dspace.entity.typePublication
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