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Investigation and Simulation of SEL Cross Sections at Different Temperatures

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dc.contributor.authorIakovlev, S.
dc.contributor.authorMrozovskaya, E.
dc.contributor.authorChubunov, P.
dc.contributor.authorZebrev, G. I.
dc.contributor.authorМрозовская, Елизавета Владимировна
dc.contributor.authorЧубунов, Павел Александрович
dc.contributor.authorЗебрев, Геннадий Иванович
dc.date.accessioned2024-12-26T09:33:01Z
dc.date.available2024-12-26T09:33:01Z
dc.date.issued2022
dc.description.abstractIEEEThe Single Event Latchup cross sections as functions of LET in different CMOS circuits were experimentally investigated at different temperatures. A simplified simulation method for the SEL cross section temperature dependence is proposed and validated.
dc.identifier.citationInvestigation and Simulation of SEL Cross Sections at Different Temperatures / Iakovlev, S. [et al.] // IEEE Transactions on Nuclear Science. - 2022. - 10.1109/TNS.2022.3156601
dc.identifier.doi10.1109/TNS.2022.3156601
dc.identifier.urihttps://www.doi.org/10.1109/TNS.2022.3156601
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85126334654&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000828698900037
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/28843
dc.relation.ispartofIEEE Transactions on Nuclear Science
dc.titleInvestigation and Simulation of SEL Cross Sections at Different Temperatures
dc.typeArticle
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