Publication:
«On-line» neutron fluence registration by silicon bipolar transistor

dc.contributor.authorButin, I. V.
dc.contributor.authorButina, A. V.
dc.contributor.authorButin, V. I.
dc.contributor.authorБутин, Валентин Иванович
dc.date.accessioned2024-11-21T08:33:13Z
dc.date.available2024-11-21T08:33:13Z
dc.date.issued2019
dc.description.abstract© 2019 Published under licence by IOP Publishing Ltd. An efficient practical method of bipolar transistor application for neutron fluence registration is presented. The method is focused on the neutron fluences damage effect correlation for various sources to reference source. The bipolar transistor connection diagram and an example of device realization based on STM32 microcontroller are described. STM32 is used for providing test signals and parameter registration used for gain factor calculation of the bipolar transistors monitor (BTM). The proposed approach allows to consider the features of BTM that is pre-irradiated at reference source and their application as the neutron fluence monitors. These connection diagram and constructive solutions provide "on-line" neutron fluence registration for different sources in terms of the reference source as required for the verification of radiation test results.
dc.identifier.citationButin, I. V. «On-line» neutron fluence registration by silicon bipolar transistor / Butin, I.V., Butina, A.V., Butin, V.I. // IOP Conference Series: Materials Science and Engineering. - 2019. - 498. - № 1. - 10.1088/1757-899X/498/1/012006
dc.identifier.doi10.1088/1757-899X/498/1/012006
dc.identifier.urihttps://www.doi.org/10.1088/1757-899X/498/1/012006
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85065575989&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000472784800006
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/18000
dc.relation.ispartofIOP Conference Series: Materials Science and Engineering
dc.title«On-line» neutron fluence registration by silicon bipolar transistor
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.issue1
oaire.citation.volume498
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