Publication:
Radiation hardness estimation in various temperature conditions under radiation impact

dc.contributor.authorBakerenkov, A. S.
dc.contributor.authorRodin, A. S.
dc.contributor.authorFelitsyn, V. A.
dc.contributor.authorPershenkov, V. S.
dc.contributor.authorБакеренков, Александр Сергеевич
dc.contributor.authorРодин, Александр Сергеевич
dc.date.accessioned2024-11-21T08:26:13Z
dc.date.available2024-11-21T08:26:13Z
dc.date.issued2019
dc.description.abstract© 2019 Published under licence by IOP Publishing Ltd. The application of the ELDRS conversion model for numerical simulation of the radiation degradation of input bias current in widely used voltage comparator is presented. The recurrence relations for numerical simulations were obtained and used calculations of the estimation of the radiation response of LM111 input bias current in real operation temperature conditions of TechEdSat satellite.
dc.identifier.citationRadiation hardness estimation in various temperature conditions under radiation impact / Bakerenkov, A.S. [et al.] // IOP Conference Series: Materials Science and Engineering. - 2019. - 498. - № 1. - 10.1088/1757-899X/498/1/012028
dc.identifier.doi10.1088/1757-899X/498/1/012028
dc.identifier.urihttps://www.doi.org/10.1088/1757-899X/498/1/012028
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85065563157&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000472784800028
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/17966
dc.relation.ispartofIOP Conference Series: Materials Science and Engineering
dc.titleRadiation hardness estimation in various temperature conditions under radiation impact
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.issue1
oaire.citation.volume498
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