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X-ray Based Electronic Components Authentication Methods to Counterfeit Detection

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dc.contributor.authorShirin, A. O.
dc.contributor.authorTaiibov, F. F.
dc.contributor.authorSimakhin, E. A.
dc.contributor.authorKessarinskiy, L. N.
dc.contributor.authorKoval, K. A.
dc.contributor.authorArtamonov, A. S.
dc.contributor.authorDurakovskiy, A. P.
dc.contributor.authorСимахин, Егор Андреевич
dc.contributor.authorКессаринский, Леонид Николаевич
dc.contributor.authorКоваль, Кирилл Александрович
dc.contributor.authorАртамонов, Алексей Сергеевич
dc.contributor.authorДураковский, Анатолий Петрович
dc.date.accessioned2024-11-29T22:38:37Z
dc.date.available2024-11-29T22:38:37Z
dc.date.issued2021
dc.description.abstract© 2021 IEEE.The problem of counterfeit products, electronic and electromechanical products is presented. One of the most effective non-destructive electronics analyses is x-ray checking, that is presented in this paper.
dc.format.extentС. 119-121
dc.identifier.citationX-ray Based Electronic Components Authentication Methods to Counterfeit Detection / Shirin, A.O. [et al.] // Proceedings of the International Conference on Microelectronics, ICM. - 2021. - 2021-September. - P. 119-121. - 10.1109/MIEL52794.2021.9569042
dc.identifier.doi10.1109/MIEL52794.2021.9569042
dc.identifier.urihttps://www.doi.org/10.1109/MIEL52794.2021.9569042
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85118435311&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/24918
dc.relation.ispartofProceedings of the International Conference on Microelectronics, ICM
dc.titleX-ray Based Electronic Components Authentication Methods to Counterfeit Detection
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.volume2021-September
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