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Predictive Analysis of Microcircuits’ Radiation Hardness in the Fabrication Process. II. Selection of Test Objects and the Statistical Processing of the Obtained Results

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dc.contributor.authorMoskovskaya, Y. M.
dc.contributor.authorBoychenko, D. V.
dc.contributor.authorМосковская, Юлия Марковна
dc.contributor.authorБойченко, Дмитрий Владимирович
dc.date.accessioned2025-05-21T15:44:02Z
dc.date.available2025-05-21T15:44:02Z
dc.date.issued2024
dc.format.extentС. 696-703
dc.identifier.citationMoskovskaya, Y. M. Predictive Analysis of Microcircuits’ Radiation Hardness in the Fabrication Process. II. Selection of Test Objects and the Statistical Processing of the Obtained Results / Moskovskaya, Y. M., Boychenko, D. V. // Russian Microelectronics. - 2024. - 53. - № 7. - P. 696-703. - 10.1134/S1063739724700847
dc.identifier.doi10.1134/S1063739724700847
dc.identifier.urihttps://www.doi.org/10.1134/S1063739724700847
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85218221846&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/37503
dc.relation.ispartofRussian Microelectronics
dc.titlePredictive Analysis of Microcircuits’ Radiation Hardness in the Fabrication Process. II. Selection of Test Objects and the Statistical Processing of the Obtained Results
dc.typeArticle
dspace.entity.typePublication
oaire.citation.issue7
oaire.citation.volume53
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