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The SEE Test Results of the different analog devices

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dc.contributor.authorKalashnikova, A. A.
dc.contributor.authorMaksimenko, T. A.
dc.contributor.authorKoziukov, A. E.
dc.contributor.authorChubunov, P. A.
dc.contributor.authorЧубунов, Павел Александрович
dc.date.accessioned2024-11-30T04:08:45Z
dc.date.available2024-11-30T04:08:45Z
dc.date.issued2021
dc.description.abstractThe article presents the results of singlt event effect (SEE) testing samples of various representatives of analog microcircuits: operational amplifiers (OpAmp), relays, voltage regulators and transistor. © 2021 IEEE.
dc.identifier.citationThe SEE Test Results of the different analog devices / Kalashnikova, A.A. [et al.] // RADECS 2021 - European Conference on Radiation and its Effects on Components and Systems. - 2021. - 10.1109/RADECS53308.2021.9954521
dc.identifier.doi10.1109/RADECS53308.2021.9954521
dc.identifier.urihttps://www.doi.org/10.1109/RADECS53308.2021.9954521
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85143895428&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/25429
dc.relation.ispartofRADECS 2021 - European Conference on Radiation and its Effects on Components and Systems
dc.titleThe SEE Test Results of the different analog devices
dc.typeConference Paper
dspace.entity.typePublication
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relation.isAuthorOfPublication.latestForDiscovery17cb37ba-7e66-4ec0-b5f4-85e833303ac2
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