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Automation of Pulse Electric Strength Test of Electronic Component Base

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dc.contributor.authorDyatlov, N. S.
dc.contributor.authorEpifantsev, K. A.
dc.contributor.authorSkorobogatov, P. K.
dc.contributor.authorЕпифанцев, Константин Алексеевич
dc.contributor.authorСкоробогатов, Петр Константинович
dc.date.accessioned2024-11-21T14:39:58Z
dc.date.available2024-11-21T14:39:58Z
dc.date.issued2019
dc.description.abstract© 2019, Pleiades Publishing, Ltd.Abstract: During the pulse electric strength test of the electronic component base (ECB), the single pulsing electrical overstress (EOS) of increasing amplitude affects the tested specimen until a functional or parametric failure of the product appears. In order to reduce the test time and minimize operator intervention, a specialized test bench was designed to perform the test in automatic mode. To have the possibility to switch the specimen between a sensitive measuring instrument and a high-voltage pulse generator, a mechanical switching device was developed, which also operates as a connecting link between test bench components. After putting the test bench into operation, the time of preparation and the test significantly decreases. Furthermore, it became possible to test the electronic component base on the multiple actions of voltage pulses.
dc.format.extentС. 340-345
dc.identifier.citationDyatlov, N. S. Automation of Pulse Electric Strength Test of Electronic Component Base / Dyatlov, N.S., Epifantsev, K.A., Skorobogatov, P.K. // Russian Microelectronics. - 2019. - 48. - № 5. - P. 340-345. - 10.1134/S1063739719050032
dc.identifier.doi10.1134/S1063739719050032
dc.identifier.urihttps://www.doi.org/10.1134/S1063739719050032
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85073195661&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/18827
dc.relation.ispartofRussian Microelectronics
dc.titleAutomation of Pulse Electric Strength Test of Electronic Component Base
dc.typeArticle
dspace.entity.typePublication
oaire.citation.issue5
oaire.citation.volume48
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