Publication:
Software and Hardware System for Charge Coupled Devices with Interline Transfer of Charge Parameters Monitoring during Radiation Tests

Простая страница элемента
dc.contributor.authorLukashin, V. P.
dc.contributor.authorCherniak, M. E.
dc.contributor.authorAkhmetov, A. O.
dc.contributor.authorNikiforov, A. Y.
dc.contributor.authorUlanova, A. V.
dc.contributor.authorЛукашин, Владислав Павлович
dc.contributor.authorНикифоров, Александр Юрьевич
dc.contributor.authorУланова, Анастасия Владиславовна
dc.date.accessioned2024-11-21T14:54:57Z
dc.date.available2024-11-21T14:54:57Z
dc.date.issued2019
dc.description.abstract© 2019 IEEE.The paper presents a method of device monitoring during radiation testing for charge coupled devices with interline transfer (hereinafter-CCD). The results of heavy ions, dose rate and total ionizing dose tests are presented together with the description of the developed software and hardware set-up based on the National Instruments platform and on the designed specialized equipment adapted for radiation tests.
dc.format.extentС. 345-348
dc.identifier.citationSoftware and Hardware System for Charge Coupled Devices with Interline Transfer of Charge Parameters Monitoring during Radiation Tests / Lukashin, V.P. [et al.] // 2019 IEEE 31st International Conference on Microelectronics, MIEL 2019 - Proceedings. - 2019. - P. 345-348. - 10.1109/MIEL.2019.8889621
dc.identifier.doi10.1109/MIEL.2019.8889621
dc.identifier.urihttps://www.doi.org/10.1109/MIEL.2019.8889621
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85075339705&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000565455600078
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/18910
dc.relation.ispartof2019 IEEE 31st International Conference on Microelectronics, MIEL 2019 - Proceedings
dc.titleSoftware and Hardware System for Charge Coupled Devices with Interline Transfer of Charge Parameters Monitoring during Radiation Tests
dc.typeConference Paper
dspace.entity.typePublication
relation.isAuthorOfPublication90642bd8-03c5-4563-bfbd-b67b6d1ab0af
relation.isAuthorOfPublication7689eb3e-fb40-4450-8e40-24096dc74d56
relation.isAuthorOfPublication5d26cec7-d899-4b11-9ce4-8d1f7531889a
relation.isAuthorOfPublication.latestForDiscovery90642bd8-03c5-4563-bfbd-b67b6d1ab0af
relation.isOrgUnitOfPublication543ffddb-d115-4466-be75-83b0f2c5a473
relation.isOrgUnitOfPublication06e1796d-4f55-4057-8d7e-bb2f3b5676f5
relation.isOrgUnitOfPublication.latestForDiscovery543ffddb-d115-4466-be75-83b0f2c5a473
Файлы
Коллекции
Публикации