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Temperature Dependence of Surface Recombination Current in Bipolar Transistors

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dc.contributor.authorBakerenkov, A.
dc.contributor.authorFelitsyn, V.
dc.contributor.authorChubunov, P.
dc.contributor.authorSkorkin, I.
dc.contributor.authorЧубунов, Павел Александрович
dc.date.accessioned2024-12-27T13:34:29Z
dc.date.available2024-12-27T13:34:29Z
dc.date.issued2023
dc.identifier.citationTemperature Dependence of Surface Recombination Current in Bipolar Transistors / Bakerenkov, A. [et al.] // 2023 5th International Conference on Radiation Effects of Electronic Devices, ICREED 2023. - 2023. - 10.1109/ICREED59404.2023.10390896
dc.identifier.doi10.1109/ICREED59404.2023.10390896
dc.identifier.urihttps://www.doi.org/10.1109/ICREED59404.2023.10390896
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85184666278&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/29639
dc.relation.ispartof2023 5th International Conference on Radiation Effects of Electronic Devices, ICREED 2023
dc.titleTemperature Dependence of Surface Recombination Current in Bipolar Transistors
dc.typeConference Paper
dspace.entity.typePublication
relation.isAuthorOfPublication17cb37ba-7e66-4ec0-b5f4-85e833303ac2
relation.isAuthorOfPublication.latestForDiscovery17cb37ba-7e66-4ec0-b5f4-85e833303ac2
relation.isOrgUnitOfPublication06e1796d-4f55-4057-8d7e-bb2f3b5676f5
relation.isOrgUnitOfPublication.latestForDiscovery06e1796d-4f55-4057-8d7e-bb2f3b5676f5
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