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Single Event Displacement Effects in a VLSI

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dc.contributor.authorChumakov, A. I.
dc.contributor.authorЧумаков, Александр Иннокентьевич
dc.date.accessioned2024-12-27T10:33:51Z
dc.date.available2024-12-27T10:33:51Z
dc.date.issued2023
dc.format.extentС. 260-266
dc.identifier.citationChumakov, A. I. Single Event Displacement Effects in a VLSI / Chumakov, A. I. // Russian Microelectronics. - 2023. - 52. - № 4. - P. 260-266. - 10.1134/S1063739723700427
dc.identifier.doi10.1134/S1063739723700427
dc.identifier.urihttps://www.doi.org/10.1134/S1063739723700427
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85173628633&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/29339
dc.relation.ispartofRussian Microelectronics
dc.titleSingle Event Displacement Effects in a VLSI
dc.typeArticle
dspace.entity.typePublication
oaire.citation.issue4
oaire.citation.volume52
relation.isAuthorOfPublication43b0636e-accc-40f9-b290-f89ddec0684e
relation.isAuthorOfPublication.latestForDiscovery43b0636e-accc-40f9-b290-f89ddec0684e
relation.isOrgUnitOfPublication543ffddb-d115-4466-be75-83b0f2c5a473
relation.isOrgUnitOfPublication.latestForDiscovery543ffddb-d115-4466-be75-83b0f2c5a473
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