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TID Impact on SEL Sensitivity in the Case of High Latchup Holding Voltage

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dc.contributor.authorNovikov, A. A.
dc.contributor.authorShvetsov-Shilovskiy, I. I.
dc.contributor.authorOblova, E. N.
dc.contributor.authorPechenkin, A. A.
dc.contributor.authorChumakov, A. I.
dc.contributor.authorШвецов-Шиловский, Иван Иванович
dc.contributor.authorПеченкин, Александр Александрович
dc.contributor.authorЧумаков, Александр Иннокентьевич
dc.date.accessioned2024-11-29T22:41:34Z
dc.date.available2024-11-29T22:41:34Z
dc.date.issued2021
dc.description.abstract© 2021 IEEE.In an Integrated Circuit with high SEL holding voltage, pulsed-laser radiation sensitivity was found to change due to TID irradiation. The impact of TID on the DUT SEL holding voltage and SEL sensitivity was investigated.
dc.format.extentС. 371-373
dc.identifier.citationTID Impact on SEL Sensitivity in the Case of High Latchup Holding Voltage / Novikov, A.A. [et al.] // Proceedings of the International Conference on Microelectronics, ICM. - 2021. - 2021-September. - P. 371-373. - 10.1109/MIEL52794.2021.9569140
dc.identifier.doi10.1109/MIEL52794.2021.9569140
dc.identifier.urihttps://www.doi.org/10.1109/MIEL52794.2021.9569140
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85118426914&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/24922
dc.relation.ispartofProceedings of the International Conference on Microelectronics, ICM
dc.titleTID Impact on SEL Sensitivity in the Case of High Latchup Holding Voltage
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.volume2021-September
relation.isAuthorOfPublicationbbd56715-26ac-4f6a-aefd-13c9cc75fd91
relation.isAuthorOfPublication69e0f0b5-e2c8-44a1-a497-5e79154c0589
relation.isAuthorOfPublication43b0636e-accc-40f9-b290-f89ddec0684e
relation.isAuthorOfPublication.latestForDiscoverybbd56715-26ac-4f6a-aefd-13c9cc75fd91
relation.isOrgUnitOfPublication06e1796d-4f55-4057-8d7e-bb2f3b5676f5
relation.isOrgUnitOfPublication543ffddb-d115-4466-be75-83b0f2c5a473
relation.isOrgUnitOfPublication.latestForDiscovery06e1796d-4f55-4057-8d7e-bb2f3b5676f5
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