Publication:
On the Possibility of Surface Analysis by keV-Energy Proton Scattering in Magnetic Fusion Devices

Дата
2020
Авторы
Kurnaev, V.
Bulgadaryan, D. G.
Sinelnikov, D. N.
Journal Title
Journal ISSN
Volume Title
Издатель
Научные группы
Организационные подразделения
Организационная единица
Институт лазерных и плазменных технологий
Стратегическая цель Института ЛаПлаз – стать ведущей научной школой и ядром развития инноваций по лазерным, плазменным, радиационным и ускорительным технологиям, с уникальными образовательными программами, востребованными на российском и мировом рынке образовательных услуг.
Выпуск журнала
Аннотация
© 2020, Pleiades Publishing, Ltd.Abstract: The processes of erosion and redeposition of plasma-facing materials in fusion devices are some of the most important factors affecting the plasma parameters and the resource of the first wall. The method of analyzing thin layers on a surface using keV-energy proton scattering expands the functionality of determining the rate of erosion and deposition of layers with a large atomic number on a substrate of a light element or, conversely, light layers on a heavy substrate, which is typical of modern fusion installations. The analysis of deposition and/or erosion consists in placing special marker targets with the layers of a material with a low atomic number and/or material with a large atomic number in the places of the installation in which it is proposed to study the rate of erosion and/or deposition, with a subsequent analysis of the energy spectra of hydrogen ions reflected from exposed targets with energies in the kiloelectron-volt range. In this paper, estimates of the applicability of this technique directly in a fusion device with regard to the characteristic parameters of the near-edge plasma are given.
Описание
Ключевые слова
Цитирование
Kurnaev, V. On the Possibility of Surface Analysis by keV-Energy Proton Scattering in Magnetic Fusion Devices / Kurnaev, V.A., Bulgadaryan, D.G., Sinelnikov, D.N. // Physics of Atomic Nuclei. - 2020. - 83. - № 10. - P. 1440-1444. - 10.1134/S1063778820100117
Коллекции