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The design and testing issues of radiation tolerant microwave amplifiers implemented in the domestic GaAs pHEMT 0.5 mu m process

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dc.contributor.authorSotskov, D.
dc.contributor.authorKuznetsov, A.
dc.contributor.authorUsachev, N.
dc.contributor.authorElesin, V.
dc.contributor.authorSelishchev, I.
dc.contributor.authorСотсков, Денис Иванович
dc.contributor.authorКузнецов, Александр Геннадьевич
dc.contributor.authorУсачев, Николай Александрович
dc.contributor.authorЕлесин, Вадим Владимирович
dc.date.accessioned2024-11-21T18:46:27Z
dc.date.available2024-11-21T18:46:27Z
dc.date.issued2019
dc.description.abstractThe investigation results of the possibility of manufacturing radiation tolerant microwave amplifiers implementing in domestic GaAs D-mode pHEMT 0.5 mu m process are presented in this work. The amplifier with an operating frequency range from 0.1 GHz to 3.5 GHz, gain above 15 dB, noise figure below 2.2 dB, output linearity above 17 dBm is designed, produced and measured. The characteristic property of the amplifier is a single positive supply voltage and extended frequency range up to 100 MHz provided by the external capacitor circuit. Transient radiation effects in the amplifier are investigated up to the dose rate value of 4.9.10(9) a.u./s. The recovery time does not exceed 4 mu s according to the experimental results.
dc.identifier.citationThe design and testing issues of radiation tolerant microwave amplifiers implemented in the domestic GaAs pHEMT 0.5 mu m process / Sotskov, D [et al.] // 29TH INTERNATIONAL CRIMEAN CONFERENCE: MICROWAVE and TELECOMMUNICATION TECHNOLOGY (CRIMICO2019). - 2019. - 30. - 10.1051/itmconf/20193010001
dc.identifier.doi10.1051/itmconf/20193010001
dc.identifier.urihttps://www.doi.org/10.1051/itmconf/20193010001
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000568227400138
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/19565
dc.relation.ispartof29TH INTERNATIONAL CRIMEAN CONFERENCE: MICROWAVE and TELECOMMUNICATION TECHNOLOGY (CRIMICO2019)
dc.titleThe design and testing issues of radiation tolerant microwave amplifiers implemented in the domestic GaAs pHEMT 0.5 mu m process
dc.typeProceedings Paper
dspace.entity.typePublication
oaire.citation.volume30
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