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Investigation of transient radiation effects in GaAs field effect transistors under pulse ionization

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dc.contributor.authorMetelkin, I. O.
dc.contributor.authorElesin, V. V.
dc.contributor.authorKuznetsov, A. G.
dc.contributor.authorUsachev, N. А.
dc.contributor.authorЕлесин, Вадим Владимирович
dc.contributor.authorКузнецов, Александр Геннадьевич
dc.contributor.authorУсачев, Николай Александрович
dc.date.accessioned2024-11-21T19:13:06Z
dc.date.available2024-11-21T19:13:06Z
dc.date.issued2019
dc.description.abstract© 2019 IEEE.Measurements and numerical simulation results of GaAs MESFET and PHEMT response to transient irradiation for wide range of ionization levels and bias conditions are presented. It was shown that specific bias conditions and ionization levels can be found for detail separate investigation of channel current change and bipolar-like amplification effects. Simple Shockley FET model was found to be applicable to analyze channel current change due to photovoltage occurrence at channel-buffer junction.
dc.identifier.citationInvestigation of transient radiation effects in GaAs field effect transistors under pulse ionization / Metelkin, I.O. [et al.] // 2019 19th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2019. - 2019. - 10.1109/RADECS47380.2019.9745656
dc.identifier.doi10.1109/RADECS47380.2019.9745656
dc.identifier.urihttps://www.doi.org/10.1109/RADECS47380.2019.9745656
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85128553173&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000848160100010
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/19645
dc.relation.ispartof2019 19th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2019
dc.titleInvestigation of transient radiation effects in GaAs field effect transistors under pulse ionization
dc.typeConference Paper
dspace.entity.typePublication
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