Publication:
Deuterium Retention in a Nanostructured Tungsten Surface Layer Formed during High-Temperature Irradiation with Helium Plasma

Простая страница элемента
dc.contributor.authorHarutyunyan, Z. R.
dc.contributor.authorOgorodnikova, O. V.
dc.contributor.authorAksenova, A. S.
dc.contributor.authorGasparyan, Y. M.
dc.contributor.authorEfimov, V. S.
dc.contributor.authorKharkov, M. M.
dc.contributor.authorKaziev, A. V.
dc.contributor.authorVolkov, N. V.
dc.contributor.authorАрутюнян, Зорий Робертович
dc.contributor.authorОгородникова, Ольга Вячеславовна
dc.contributor.authorАксенова, Александра Сергеевна
dc.contributor.authorГаспарян, Юрий Микаэлович
dc.contributor.authorЕфимов, Виталий Сергеевич
dc.contributor.authorХарьков, Максим Михайлович
dc.contributor.authorКазиев, Андрей Викторович
dc.date.accessioned2024-11-27T16:05:48Z
dc.date.available2024-11-27T16:05:48Z
dc.date.issued2020
dc.description.abstractThe preliminary irradiation of a tungsten sample with low-energy helium ions (80 eV, flux of 10(21) m(-2) s(-1)) at a temperature of 1200-1250 K in a facility with an inductive RF discharge leads to the formation of a nanostructured tungsten surface layer, which is referred to as fuzz. After that, the sample is subjected to a set of annealing procedures and irradiations with ions with an energy of 2 keV (0.67 keV per D) at low fluences of 10(19)-10(20) m(-2). Deuterium retention at each stage is analyzed by in-situ thermal desorption spectroscopy. An increase in the helium concentration in the sample leads to a significant change of deuterium retention. At high helium concentrations, deuterium retention becomes low. Annealing in the temperature range of 1000-1400 K leads to helium desorption, modification of the surface layer and defects, and, as a consequence, an increase in the amplitude of the main deuterium desorption peak and a shift of the peak to higher temperatures. Annealing at a temperature of 1600 K leads to removal of the nanostructured fuzz from the tungsten surface and a decrease in the deuterium retention on account of an increase in the reflection coefficient from a smoother surface.
dc.format.extentС. 1248-1253
dc.identifier.citationDeuterium Retention in a Nanostructured Tungsten Surface Layer Formed during High-Temperature Irradiation with Helium Plasma / Harutyunyan, ZR [et al.] // Journal of Surface Investigation. - 2020. - 14. - № 6. - P. 1248-1253. - 10.1134/S1027451020060245
dc.identifier.doi10.1134/S1027451020060245
dc.identifier.urihttps://www.doi.org/10.1134/S1027451020060245
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85098252380&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000603321400022
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/23056
dc.relation.ispartofJournal of Surface Investigation
dc.titleDeuterium Retention in a Nanostructured Tungsten Surface Layer Formed during High-Temperature Irradiation with Helium Plasma
dc.typeArticle
dspace.entity.typePublication
oaire.citation.issue6
oaire.citation.volume14
relation.isAuthorOfPublicationcb123627-1290-4baf-b9fa-36a121e2f719
relation.isAuthorOfPublication4060fa10-4dcf-4c82-a27a-80a301c87f28
relation.isAuthorOfPublicatione1731f71-2745-4e0d-93f3-65ac30dfba52
relation.isAuthorOfPublication7c09c13b-5454-4e2d-960e-7785484ee06a
relation.isAuthorOfPublicationaab0d99a-8361-4918-ba3a-3b41bc7fe752
relation.isAuthorOfPublication8bcb6d05-5e53-4b0c-a287-3acc05a84313
relation.isAuthorOfPublicationc70d4049-e1f0-4840-8e36-73b5eeafc0a2
relation.isAuthorOfPublication.latestForDiscoverycb123627-1290-4baf-b9fa-36a121e2f719
relation.isOrgUnitOfPublicationdcdb137c-0528-46a5-841b-780227a67cce
relation.isOrgUnitOfPublicationba0b4738-e6bd-4285-bda5-16ab2240dbd1
relation.isOrgUnitOfPublication.latestForDiscoverydcdb137c-0528-46a5-841b-780227a67cce
Файлы
Коллекции
Публикации