Publication:
Evaluation of Organic Light-Emitting Diodes Total Ionizing Dose Sensitivity in Temperature Range

dc.contributor.authorMozhaev, R. K.
dc.contributor.authorPechenkin, A. A.
dc.contributor.authorUkolov, D. S.
dc.contributor.authorUlanova, A. V.
dc.contributor.authorNikiforov, A. Y.
dc.contributor.authorМожаев, Роман Константинович
dc.contributor.authorПеченкин, Александр Александрович
dc.contributor.authorУланова, Анастасия Владиславовна
dc.contributor.authorНикифоров, Александр Юрьевич
dc.date.accessioned2024-11-29T22:39:28Z
dc.date.available2024-11-29T22:39:28Z
dc.date.issued2021
dc.description.abstract© 2021 IEEE.The paper presents the comparative results of spectrum degradation organic light-emitting diode with different dominant wavelengths. The diodes were exposed with stationary gamma-irradiation at room and low temperatures. The research has shown moderate degradation of the light-emission spectrum when exposed at room temperature and significant degradation at low temperature. The greatest deterioration in the optical parameters was observed for organic light-emitting diodes with blue and white light emission color.
dc.format.extentС. 357-360
dc.identifier.citationEvaluation of Organic Light-Emitting Diodes Total Ionizing Dose Sensitivity in Temperature Range / Mozhaev, R.K. [et al.] // Proceedings of the International Conference on Microelectronics, ICM. - 2021. - 2021-September. - P. 357-360. - 10.1109/MIEL52794.2021.9569164
dc.identifier.doi10.1109/MIEL52794.2021.9569164
dc.identifier.urihttps://www.doi.org/10.1109/MIEL52794.2021.9569164
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85118432441&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/24919
dc.relation.ispartofProceedings of the International Conference on Microelectronics, ICM
dc.titleEvaluation of Organic Light-Emitting Diodes Total Ionizing Dose Sensitivity in Temperature Range
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.volume2021-September
relation.isAuthorOfPublicatione5fba163-355d-4116-8151-4229dadb5809
relation.isAuthorOfPublication69e0f0b5-e2c8-44a1-a497-5e79154c0589
relation.isAuthorOfPublication5d26cec7-d899-4b11-9ce4-8d1f7531889a
relation.isAuthorOfPublication7689eb3e-fb40-4450-8e40-24096dc74d56
relation.isAuthorOfPublication.latestForDiscoverye5fba163-355d-4116-8151-4229dadb5809
relation.isOrgUnitOfPublication543ffddb-d115-4466-be75-83b0f2c5a473
relation.isOrgUnitOfPublication06e1796d-4f55-4057-8d7e-bb2f3b5676f5
relation.isOrgUnitOfPublication.latestForDiscovery543ffddb-d115-4466-be75-83b0f2c5a473
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