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Soft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range

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dc.contributor.authorMakarov, S.
dc.contributor.authorPikuz, S.
dc.contributor.authorRyazantsev, S.
dc.contributor.authorPikuz, T.
dc.contributor.authorZaluzhnyy, I.
dc.contributor.authorVartanyants, I. A.
dc.date.accessioned2024-11-26T12:52:31Z
dc.date.available2024-11-26T12:52:31Z
dc.date.issued2020
dc.description.abstractThe unique diagnostic possibilities of X-ray diffraction, small X-ray scattering and phase-contrast imaging techniques applied with high-intensity coherent X-ray synchrotron and X-ray free-electron laser radiation can only be fully realized if a sufficient dynamic range and/or spatial resolution of the detector is available. In this work, it is demonstrated that the use of lithium fluoride (LiF) as a photoluminescence (PL) imaging detector allows measuring of an X-ray diffraction image with a dynamic range of similar to 10(7) within the sub-micrometre spatial resolution. At the PETRA III facility, the diffraction pattern created behind a circular aperture with a diameter of 5 mu m irradiated by a beam with a photon energy of 500 eV was recorded on a LiF crystal. In the diffraction pattern, the accumulated dose was varied from 1.7 x 10(5) J cm(-3) in the central maximum to 2 x 10(-2) J cm(-3) in the 16th maximum of diffraction fringes. The period of the last fringe was measured with 0.8 mu m width. The PL response of the LiF crystal being used as a detector on the irradiation dose of 500 eV photons was evaluated. For the particular model of laser-scanning confocal microscope Carl Zeiss LSM700, used for the readout of the PL signal, the calibration dependencies on the intensity of photopumping (excitation) radiation (lambda = 488 nm) and the gain have been obtained.
dc.format.extentС. 625-632
dc.identifier.citationSoft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range / Makarov, S [et al.] // Journal of Synchrotron Radiation. - 2020. - 27. - P. 625-632. - 10.1107/S1600577520002192
dc.identifier.doi10.1107/S1600577520002192
dc.identifier.urihttps://www.doi.org/10.1107/S1600577520002192
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85084392063&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000531472900008
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/21663
dc.relation.ispartofJournal of Synchrotron Radiation
dc.titleSoft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range
dc.typeArticle
dspace.entity.typePublication
oaire.citation.volume27
relation.isOrgUnitOfPublicationdcdb137c-0528-46a5-841b-780227a67cce
relation.isOrgUnitOfPublication.latestForDiscoverydcdb137c-0528-46a5-841b-780227a67cce
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