Publication:
Radiative Characteristics of Xe2Cl* Molecules under High-Energy Electron Pumping of Xe-CCl4 and Ar-Xe-CCl4 Gas Mixtures with a Low CCl4 Content

Дата
2019
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Организационные подразделения
Организационная единица
Институт лазерных и плазменных технологий
Стратегическая цель Института ЛаПлаз – стать ведущей научной школой и ядром развития инноваций по лазерным, плазменным, радиационным и ускорительным технологиям, с уникальными образовательными программами, востребованными на российском и мировом рынке образовательных услуг.
Выпуск журнала
Аннотация
Spontaneous and stimulated emissions of Xe2Cl* triplex molecules upon excitation of Xe-CCl4 gas mixtures with a low CCl4 content by a pulsed high-energy electron beam have been experimentally studied. The electron energy is 150 keV, and the pump current pulse duration and amplitude are 5 ns and 5 A, respectively. Emission of an Xe2Cl excimer molecule in the wavelength range of 430-650 nm is shown to consist of 13 narrow vibrational bands with half-widths similar to 14 nm peaking at 399, 413, 431, 451, 472, 492, 510.3, 534.9, 540.9, 551.7, 564.4, 581.6, and 603 nm. Under the given pumping conditions, a regime of weakly amplified spontaneous emission is implemented at the energy deposition to the gas of similar to 200 W/cm(3) on the axis of a 50-mm cell and the electron beam pumping in the wavelength range of 450-550 nm. Spontaneous emission of the 4(2)?-1(2)? band of a Xe2Cl* excimer molecule at (max) = 486 nm was amplified by a factor of 60 in a 100-cm cell under pumping of a dense He-3-Xe-CCl4 gas mixture by the He-3(n, p)T-3 nuclear reaction products at the energy deposition to the gas of similar to 5 mJ/cm(3) in a cavity with the mirror reflections of similar to 99.4% (totally reflecting mirror) and 98.5% (output mirror).
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Цитирование
Mis'kevich, A. I. Radiative Characteristics of Xe2Cl* Molecules under High-Energy Electron Pumping of Xe-CCl4 and Ar-Xe-CCl4 Gas Mixtures with a Low CCl4 Content / Mis'kevich, AI // Optics and Spectroscopy. - 2019. - 126. - № 4. - P. 381-387;. - 10.1134/S0030400X19040155
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