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Extreme Light Diagnostics

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dc.contributor.authorVais, O. E.
dc.contributor.authorIvanov, K. A.
dc.contributor.authorTsymbalov, I. N.
dc.contributor.authorBukharskii, N. D.
dc.contributor.authorKorneev, P. A.
dc.contributor.authorБухарский, Николай Дмитриевич
dc.contributor.authorКорнеев, Филипп Александрович
dc.date.accessioned2024-12-27T10:44:16Z
dc.date.available2024-12-27T10:44:16Z
dc.date.issued2023
dc.format.extentС. S933-S941
dc.identifier.citationExtreme Light Diagnostics / Vais, O. E. [et al.] // Bulletin of the Lebedev Physics Institute. - 2023. - 50. - P. S933-S941. - 10.3103/S1068335623200150
dc.identifier.doi10.3103/S1068335623200150
dc.identifier.urihttps://www.doi.org/10.3103/S1068335623200150
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85174409121&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/29357
dc.relation.ispartofBulletin of the Lebedev Physics Institute
dc.titleExtreme Light Diagnostics
dc.typeArticle
dspace.entity.typePublication
oaire.citation.volume50
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