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Characteristics of semiconductor pion stop tagging system

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dc.contributor.authorSandukovsky, V.
dc.contributor.authorChernyshev, B.
dc.contributor.authorGurov, Y.
dc.contributor.authorLapushkin, S.
dc.contributor.authorЧернышев, Борис Андреевич
dc.contributor.authorГуров, Юрий Борисович
dc.date.accessioned2024-11-27T15:06:39Z
dc.date.available2024-11-27T15:06:39Z
dc.date.issued2020
dc.description.abstract© Published under licence by IOP Publishing Ltd.A determination of the coordinates of charged particle stops is one of the tasks that have to be solved in a wide class of experiments. A method based on the use of semiconductor detectors (SCD) to determine the stops of particles (muons and pions) was proposed and experimentally tested. The dependence that allows calculating the stopping point of the pions in the tagging system was obtained experimentally. This dependence can be used to optimize the thickness values of monitor detectors.
dc.identifier.citationCharacteristics of semiconductor pion stop tagging system / Sandukovsky, V. [et al.] // Journal of Physics: Conference Series. - 2020. - 1690. - № 1. - 10.1088/1742-6596/1690/1/012031
dc.identifier.doi10.1088/1742-6596/1690/1/012031
dc.identifier.urihttps://www.doi.org/10.1088/1742-6596/1690/1/012031
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85098334361&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/22918
dc.relation.ispartofJournal of Physics: Conference Series
dc.titleCharacteristics of semiconductor pion stop tagging system
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.issue1
oaire.citation.volume1690
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