Publication: DEUTERIUM RETENTION IN DENSE AND DISORDERED NANOSTRUCTURED TUNGSTEN COATINGS
| dc.contributor.author | OGORODNIKOVA, O. V. | |
| dc.contributor.author | RUSET, C. | |
| dc.contributor.author | DELLASEGA, D. | |
| dc.contributor.author | PEZZOLI, А. | |
| dc.contributor.author | PASSONI, M. | |
| dc.contributor.author | SUGIYAMA, К. | |
| dc.contributor.author | GASPARYAN, YU. | |
| dc.contributor.author | EFIMOV, V. | |
| dc.contributor.author | BALDEN, M. | |
| dc.contributor.author | MATERN, G. | |
| dc.contributor.author | KOCH, F. | |
| dc.contributor.author | Огородникова, Ольга Вячеславовна | |
| dc.contributor.author | Ефимов, Виталий Сергеевич | |
| dc.contributor.author | Гаспарян, Юрий Микаэлович | |
| dc.date.accessioned | 2025-03-20T09:30:08Z | |
| dc.date.available | 2025-03-20T09:30:08Z | |
| dc.date.issued | 2017 | |
| dc.description.abstract | Three types of nano-structured tungsten (W) coatings were investigated in respect to deuterium (D) retention after the low-energy D plasma exposure. The D depth profile was measured up to 6 μm by nuclear reaction analysis (NRA) and the total deuterium retention was measured by thermal desorption spectros-copy (TDS). In the present work, we investigated (i) a dependence of the D retention in a W coating on substrate, (ii) a dependence of the D retention in a W coating on the nano-crystalline structure, namely, columnar-like or amor-phous-like, and (iii) the D retention at an interface between layers. It was shown that most of deuterium is trapped in the interlayer between W coating and substrate. Consequently, the D retention in the interlayer between different materials can be a concern. It was found that all types of coatings show higher D accumulation compared to bulk polycrystalline W. The disodered W coating produced by Pulsed Laser Deposition (PLD) has highest deuterium (D) concen-tration compared to dense W coating produced by Combined Magnetron Sput-tering and Ion Implantation (CMSII) technology and W coating produced by standard vacuum magnetron-sputtering (SMS) method. The lowest D concen-tration was found in SMS-W coating. No significant influence of the substrate on the D retention in coatings was found. The D retention correlates with mi-crostructure of multilayer W coating: the D retention drastically increases with decreasing the grain size. Consequently, from point of view of the hydrogen isotope retention, coarse-grained crystals are recommended for application of W-based materials in fusion devices. At the same time, coarse-grained crystals are undesirable from point of view of blister formation under the plasma expo-sure. Nano-crystalline structure of W coatings suppresses the blister formation. A compromise in the development of new promising nanostructured tungsten films is necessary to keep the hydrogen concentration at an acceptable level and reducing/preventing high density of defects at the interface between nanostruc-tured coating and substrate. | |
| dc.identifier.citation | DEUTERIUM RETENTION IN DENSE AND DISORDERED NANOSTRUCTURED TUNGSTEN COATINGS [Текст.] / OGORODNIKOVA O.V. [и др.] // Взаимодействие плазмы с поверхностью: сборник научных трудов XX конференции. - 2017. - С. 66 | |
| dc.identifier.uri | https://openrepository.mephi.ru/handle/123456789/36703 | |
| dc.publisher | НИЯУ МИФИ | |
| dc.subject | Конференции НИЯУ МИФИ | |
| dc.title | DEUTERIUM RETENTION IN DENSE AND DISORDERED NANOSTRUCTURED TUNGSTEN COATINGS | |
| dc.type | Article | |
| dspace.entity.type | Publication | |
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