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Clarification the reliability of electronic components used in nuclear industry

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dc.contributor.authorSamokhin, D. S.
dc.contributor.authorLeonova, T. N.
dc.contributor.authorAlslman, M.
dc.contributor.authorVostrilova, A. D.
dc.contributor.authorСамохин, Дмитрий Сергеевич
dc.contributor.authorЛеонова, Татьяна Николаевна
dc.contributor.otherФакультет бизнес-информатики и управления комплексными системами
dc.date.accessioned2024-11-20T10:52:11Z
dc.date.available2024-11-20T10:52:11Z
dc.date.issued2019
dc.description.abstract© Published under licence by IOP Publishing Ltd. When calculating the reliability indicator of any device, under specified operating condition, usually reference data on the characteristics of the reliability of the elements. Data on the reliability of the groups of electrical-radiation equipment (ERE), used in the design, manufacture and operation of equipment, instruments, devices include information on the mathematical models to calculate (predict) values for the operational intensity of product groups, including information on the storage conditions and information on the reliability groups ERE and the coefficients of the models. This paper considers methods for the refinement of correction factors to estimate the failure rate of ERE under specified conditions. The results of the work allow us to clarify the existing coefficients for the prevention and reduction of the failure rate of ERE, as well as to prevent failures of elements and systems due to personnel errors.
dc.identifier.citationClarification the reliability of electronic components used in nuclear industry / Samokhin, D.S. [et al.] // IOP Conference Series: Materials Science and Engineering. - 2019. - 487. - № 1. - 10.1088/1757-899X/487/1/012006
dc.identifier.doi10.1088/1757-899X/487/1/012006
dc.identifier.urihttps://www.doi.org/10.1088/1757-899X/487/1/012006
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85063892126&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/16832
dc.relation.ispartofIOP Conference Series: Materials Science and Engineering
dc.titleClarification the reliability of electronic components used in nuclear industry
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.issue1
oaire.citation.volume487
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