Publication:
Numerical Diagnostics of Solution Blow-Up in a Thermoelectric Semiconductor Model

dc.contributor.authorKorpusov, M. O.
dc.contributor.authorShafir, R. S.
dc.contributor.authorMatveeva, A. K.
dc.contributor.authorМатвеева, Александра Константиновна
dc.date.accessioned2024-12-04T13:22:25Z
dc.date.available2024-12-04T13:22:25Z
dc.date.issued2024
dc.format.extentС. 1595-1602
dc.identifier.citationKorpusov, M. O. Numerical Diagnostics of Solution Blow-Up in a Thermoelectric Semiconductor Model / Korpusov, M.O., Shafir, R.S., Matveeva, A.K. // Computational Mathematics and Mathematical Physics. - 2024. - 64. - № 7. - P. 1595-1602. - 10.1134/S0965542524700647
dc.identifier.doi10.1134/S0965542524700647
dc.identifier.urihttps://www.doi.org/10.1134/S0965542524700647
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85202792273&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/26245
dc.relation.ispartofComputational Mathematics and Mathematical Physics
dc.titleNumerical Diagnostics of Solution Blow-Up in a Thermoelectric Semiconductor Model
dc.typeArticle
dspace.entity.typePublication
oaire.citation.issue7
oaire.citation.volume64
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