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Xenon gamma-ray spectrometers: Development and applications

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dc.contributor.authorNovikov, A. S.
dc.contributor.authorUlin, S. E.
dc.contributor.authorDmitrenko, V. V.
dc.contributor.authorChernysheva, I. V.
dc.contributor.authorGrachev, V. M.
dc.contributor.authorKrivova, K. V.
dc.contributor.authorShustov, A. E.
dc.contributor.authorUteshev, Z. M.
dc.contributor.authorVlasik, K. F.
dc.contributor.authorУлин, Сергей Евгеньевич
dc.contributor.authorДмитренко, Валерий Васильевич
dc.contributor.authorЧернышева, Ирина Вячеславовна
dc.contributor.authorГрачев, Виктор Михайлович
dc.contributor.authorКривова, Кира Валериановна
dc.contributor.authorШустов, Александр Евгеньевич
dc.contributor.authorУтешев, Зияэтдин Мухамедович
dc.contributor.authorВласик, Константин Федорович
dc.date.accessioned2024-11-21T17:27:41Z
dc.date.available2024-11-21T17:27:41Z
dc.date.issued2019
dc.description.abstract© 2019 SPIE.The description of xenon gamma-ray spectrometers is presented. These devices can be produced with various sensitive volumes (0.2 - 6.0 liters), they provide high energy resolution (∼2% at 662 keV) and are capable of operation in unfavorable conditions (wide temperature range and high level of vibro-acoustic influence). Xenon gamma-ray spectrometers can be used for various fundamental and applied tasks, the outcomes of those applications and the prospect of the detector utilization in various fields are also presented.
dc.identifier.citationXenon gamma-ray spectrometers: Development and applications / Novikov, A.S. [et al.] // Proceedings of SPIE - The International Society for Optical Engineering. - 2019. - 11114. - 10.1117/12.2528753
dc.identifier.doi10.1117/12.2528753
dc.identifier.urihttps://www.doi.org/10.1117/12.2528753
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85077961258&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000511293300008
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/19342
dc.relation.ispartofProceedings of SPIE - The International Society for Optical Engineering
dc.titleXenon gamma-ray spectrometers: Development and applications
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.volume11114
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