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Influence of long-term exposure of high-density direct current on the current carrying ability of 2G HTSC tapes based on the REBCO

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dc.contributor.authorVeselova, S.
dc.contributor.authorOsipov, M.
dc.contributor.authorStarikovskii, A.
dc.contributor.authorAnishenko, I.
dc.contributor.authorPokrovskii, S.
dc.contributor.authorAbin, D.
dc.contributor.authorRudnev, I.
dc.contributor.authorВеселова, Светлана Владимировна
dc.contributor.authorОсипов, Максим Андреевич
dc.contributor.authorСтариковский, Александр Сергеевич
dc.contributor.authorМартиросян, Ирина Валерьевна
dc.contributor.authorПокровский, Сергей Владимирович
dc.contributor.authorАбин, Дмитрий Александрович
dc.contributor.authorРуднев, Игорь Анатольевич
dc.date.accessioned2024-11-29T18:36:54Z
dc.date.available2024-11-29T18:36:54Z
dc.date.issued2021
dc.description.abstract© Published under licence by IOP Publishing Ltd.In this work, the phenomena of electromigration in samples of HTSC tapes of the 2nd generation was investigated. Samples of REBa2Cu3O7-x (REBCO, where RE is a rare earth element) were used in the form of a copper-plated tape. A superconducting bridge was preliminarily formed on the surface of the tape by the method of chemical etching (to decrease the total value of critical current). The sample was exposed by a direct current of I = 0.9Ic . The duration of exposure was up to 350 hours. The value of the current density in the area of the bridge was J = 1.38 1010A/m2. The measurements were carried out at liquid nitrogen temperature (77 K). The influence of the electric current flow on the value of the sample critical current is controlled at the selected time intervals. The experiment showed high stability of the tape under the specified conditions.
dc.identifier.citationInfluence of long-term exposure of high-density direct current on the current carrying ability of 2G HTSC tapes based on the REBCO / Veselova, S. [et al.] // Journal of Physics: Conference Series. - 2021. - 1975. - № 1. - 10.1088/1742-6596/1975/1/012015
dc.identifier.doi10.1088/1742-6596/1975/1/012015
dc.identifier.urihttps://www.doi.org/10.1088/1742-6596/1975/1/012015
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85112459031&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000709551600015
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/24480
dc.relation.ispartofJournal of Physics: Conference Series
dc.titleInfluence of long-term exposure of high-density direct current on the current carrying ability of 2G HTSC tapes based on the REBCO
dc.typeConference Paper
dspace.entity.typePublication
oaire.citation.issue1
oaire.citation.volume1975
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