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The Influence of Integrated Resistors Formed under Ion Irradiation on the Superconducting Transitions of Niobium Nitride Nanoconductors

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dc.contributor.authorGurovich, B. A.
dc.contributor.authorGoncharov, B. V.
dc.contributor.authorDement'eva, M. M.
dc.contributor.authorKutuzov, L. V.
dc.contributor.authorPrikhod'ko, K. E.
dc.contributor.authorПриходько, Кирилл Евгеньевич
dc.date.accessioned2024-11-27T09:58:54Z
dc.date.available2024-11-27T09:58:54Z
dc.date.issued2020
dc.description.abstract© 2020, Pleiades Publishing, Ltd.Abstract: The influence of integrated resistors formed under irradiation in a nanowire on its superconducting transitions has been investigated. Niobium nitride nanowires with widths of 75–20 000 nm fabricated from a 5-nm-thick NbN film on single-crystal silicon substrates coated with a 0.3-μm-thick thermal silicon oxide layer and on sapphire substrates have been considered. The influence of a built-in resistive region on the critical current of transition from the superconducting to normal state is described.
dc.format.extentС. 1777-1779
dc.identifier.citationThe Influence of Integrated Resistors Formed under Ion Irradiation on the Superconducting Transitions of Niobium Nitride Nanoconductors / Gurovich, B.A. [et al.] // Technical Physics. - 2020. - 65. - № 11. - P. 1777-1779. - 10.1134/S1063784220110146
dc.identifier.doi10.1134/S1063784220110146
dc.identifier.urihttps://www.doi.org/10.1134/S1063784220110146
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85096317648&origin=resultslist
dc.identifier.urihttp://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS_CPL&DestLinkType=FullRecord&UT=WOS:000590524800012
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/22595
dc.relation.ispartofTechnical Physics
dc.titleThe Influence of Integrated Resistors Formed under Ion Irradiation on the Superconducting Transitions of Niobium Nitride Nanoconductors
dc.typeArticle
dspace.entity.typePublication
oaire.citation.issue11
oaire.citation.volume65
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relation.isAuthorOfPublication.latestForDiscovery162432cf-0190-45b0-93f6-e38eae07a362
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