Publication:
The Microwave Test and Measurement System for On-wafer Investigation under Irradiation

Простая страница элемента
dc.contributor.authorAmburkin, K.
dc.contributor.authorKuznetsov, A.
dc.contributor.authorUsachev, N.
dc.contributor.authorChukov, G.
dc.contributor.authorElesin, V.
dc.contributor.authorSotskov, D.
dc.contributor.authorУсачев, Николай Александрович
dc.contributor.authorЧуков, Георгий Викторович
dc.contributor.authorЕлесин, Вадим Владимирович
dc.contributor.authorСотсков, Денис Иванович
dc.date.accessioned2024-12-25T15:51:27Z
dc.date.available2024-12-25T15:51:27Z
dc.date.issued2022
dc.description.abstract© 2022 IEEE.The Microwave automated test and measurement system (ATMS) for on-wafer total ionizing dose and dose rate effects investigations is described. The ATMS is based on Cascade PM5 probe station and measurement hardware providing on-wafer investigations of RF and MW ICs with operating frequencies up to 67 GHz. The ATMS is equipped with radiation sources: RIK-0401 X-Ray Source and Radon-8M Laser Source. Dosimetry of radiation sources provided by calibration researches methodologies is described. All measurement hardware and radiation sources are interconnected into single work network controlled by PC with specialized software. The ATMS is used for radiation characterization of RF ICs, IP-blocks, and test structures during an on-wafer investigation. The results of ATMS approbation during 180 nm SOI CMOS process characterization are present.
dc.identifier.citationThe Microwave Test and Measurement System for On-wafer Investigation under Irradiation / Amburkin, K. [et al.] // Moscow Workshop on Electronic and Networking Technologies, MWENT 2022 - Proceedings. - 2022. - 10.1109/MWENT55238.2022.9802448
dc.identifier.doi10.1109/MWENT55238.2022.9802448
dc.identifier.urihttps://www.doi.org/10.1109/MWENT55238.2022.9802448
dc.identifier.urihttps://www.scopus.com/record/display.uri?eid=2-s2.0-85134079182&origin=resultslist
dc.identifier.urihttps://openrepository.mephi.ru/handle/123456789/28118
dc.relation.ispartofMoscow Workshop on Electronic and Networking Technologies, MWENT 2022 - Proceedings
dc.titleThe Microwave Test and Measurement System for On-wafer Investigation under Irradiation
dc.typeConference Paper
dspace.entity.typePublication
relation.isAuthorOfPublicationfc7699f3-cbf0-4021-9c88-a08fa1c76ad3
relation.isAuthorOfPublicationd724e4cb-714a-4e50-a262-ce949f36fd58
relation.isAuthorOfPublication608226cb-7326-48db-8860-0267814b0820
relation.isAuthorOfPublicationcadd9d6c-774c-43ae-b00e-388fa8690f2d
relation.isAuthorOfPublication.latestForDiscoveryfc7699f3-cbf0-4021-9c88-a08fa1c76ad3
relation.isOrgUnitOfPublication06e1796d-4f55-4057-8d7e-bb2f3b5676f5
relation.isOrgUnitOfPublication.latestForDiscovery06e1796d-4f55-4057-8d7e-bb2f3b5676f5
Файлы
Коллекции
Публикации